CDI Products |
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The CCHAR high-aspect ratio CNT AFM probe, are designed for critical dimension measurements and imaging high-Z structures in materials science, metrology and life science applications. The standard CNT probe length is approximately 1µm overall with < 500nm of exposed CNT tip. These two dimensions can also be custom engineered to user specifications.
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The CCHR high-resolution CNT AFM probes are designed for detailed imaging in metrology and materials science applications. The standard CNT probe length is 500 nm, with the exposed CNT tip <200 nm.
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CDI AFM Probes |
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CCHAR CCHR
High-aspect ratio High-resolution |
For More Information, please contact:
Sid Ragona, Ph.D.
Ragona Scientific
ph./fax (585) 249-7692
sid2006@rochester.rr.com
www.ragonascientific.com
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Features at a glance
CDI has developed a revolutionary new class of AFM probes, with carbon nanotube (CNT) tips, that enable unprecedented levels of imaging clarity and precision measurement for research and industrial applications.
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Compatible with all major AFM systems
C|D|I probes are made to be completely compatible with all major AFM systems. For this reason, CNT AFM Probes from C|D|I allow users to improve their results on any platform – without making an investment in new capital equipment. C|D|I probes allow for improved total cost of ownership because they are stronger and longer lived, eliminating the need for frequent probe changes that interrupt productivity.
For More Information, please contact:
Sid Ragona, Ph.D.
Ragona Scientific
ph./fax (585) 249-7692
sid2006@rochester.rr.com
www.ragonascientific.com
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RagonaScientific © 2011 | |
